 | | |
|---|---|---|
Brand / Model / Name | Chroma 3380 | Chroma 3160 |
Core Test Services
Testar provides Semiconductor Testing Service in Wafer Probing and Final Testing.
Our testing service covers a wide range of applications, such as logic devices, MCU, Interface controller IC, sensor controller, A/D and D/A converter,... etc. Which are mainly used in consumer electronics and communication devices.
Testar is capable to handle 5, 6, 8 and 12" wafers with inkless or off-line ink process inside our class-1K environment. Our Final Testing Service performs electrical testing as well as customized test items, program and parameters. The pick-and-place handler could cover diversified package type of devices.
Testar Semiconductor Testing also provides below Engineering services to make your device fast "Time to Market".
Our testing service covers a wide range of applications, such as logic devices, MCU, Interface controller IC, sensor controller, A/D and D/A converter,... etc. Which are mainly used in consumer electronics and communication devices.
Testar is capable to handle 5, 6, 8 and 12" wafers with inkless or off-line ink process inside our class-1K environment. Our Final Testing Service performs electrical testing as well as customized test items, program and parameters. The pick-and-place handler could cover diversified package type of devices.
Testar Semiconductor Testing also provides below Engineering services to make your device fast "Time to Market".
- Test program development
- Test program conversion
- Test Time reduction
- DFT consultant
- Multi-Site Testing development
Chroma 3380
VLSI Test System
- 50/100 MHz clock rate
- 50/100 Mbps data rate
- 1024 I/O pins (max. 1280 I/O pins)
- Up to 1024 sites parallel testing
- 32/64/128M pattern memory
- 16M capture memory per pin
- Various VI source
- Flexible hardware architecture (interchangeable I/O, VI, ADDA)
- Real parallel trim/match function
- Time and frequency measurement unit (TFMU)
- STDF tools support
- Test program/pattern converter (J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.)
- AD/DA test (16/24 bits option)
- SCAN test option (max. 2G bits/chain)
- ALPG test option for embedded memory
- CRAFT C/C++ programming language
- Software interface same as 3380P/3360P
- User-friendly Windows 7/ Windows 10 environment
Chroma 3160
(Fingerprint) Quad Site Final Test Handler
- Flexible DUT Configuration
- Adjustable P&P Interval
- Air damper buffer to reduce contact force impact
- Intelligent socket IC leftover check
- Auto Contact Force Learning
- Color Tray Mode availability
- Yield Monitor (per contact dead)
- Yield Control (average yield rate of socket)
- Compatible change kits with NS-5000 / 6000 / 6040