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Vision & Mission
Test Services
Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
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VCSEL Tester - Chroma 58635
LED Total Power Test System
VCSEL Tester - Chroma 58212-C
Testar 晶測電子
Test Services
Chip Probing
Key Feature
Up to 6" wafer
Wide range and precise temperature control
Support both pulse and CW operation
Support LIV, Far-Field, Near-Field
Spectrum measurement
Light responsivity test
Calibration effectiveness and IV characteristic managed by MES
Request For Quote
+886-3-327-9600
testarservice@testar.com.tw
68,Hwa-Ya 1st Road, Hwa-Ya Technology Park, Taoyuan 333, Taiwan
333桃園市龜山區華亞科學園區華亞一路68號
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About
Vision & Mission
Test Services
Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
Semiconductor Testing
Chip Probing
IC Functional Testing
Advantage
News
Contact