VCSEL Testing

LED Total Power Test System

LED Die Probing

Key Feature

  • Up to 6" wafer
  • Wide range and precise temperature control
  • Support both pulse and CW operation
  • Support LIV, Far-Field, Near-Field
  • Spectrum measurement
  • Light responsivity test
  • Calibration effectiveness and IV characteristic managed by MES
68,Hwa-Ya 1st Road, Hwa-Ya Technology Park, Taoyuan Hsien 333, Taiwan

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