Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
BURN-IN
Semiconductor Testing
Chip Probing
IC Functional Testing
+886-3-327-9600
7F and 8F., No. 99, Wenxin Rd., Guishan Dist., Taoyuan City 333001, Taiwan333001桃園市龜山區文信路99號7、8樓