| | | |
|---|---|---|---|
BRAND / Model | Chroma 3680 | Chroma 3650 | Chroma 3380 |
Date Rate | 150Mbps, up to 1Gbps (muxed) | 50/100Mbps; 200Mbps (MUX mode) | 50/100Mbps |
Core Test Services
Testar provides Semiconductor Testing Service in Wafer Probing and Final Testing.
Our testing service covers a wide range of applications, such as logic devices, MCU, Interface controller IC, sensor controller, A/D and D/A converter,... etc. Which are mainly used in consumer electronics and communication devices.
Testar is capable to handle 5, 6, 8 and 12" wafers with inkless or off-line ink process inside our class-1K environment. Our Final Testing Service performs electrical testing as well as customized test items, program and parameters. The pick-and-place handler could cover diversified package type of devices.
Testar Semiconductor Tesing also provides below Engineering services to make your device fast "Time to Market".
Our testing service covers a wide range of applications, such as logic devices, MCU, Interface controller IC, sensor controller, A/D and D/A converter,... etc. Which are mainly used in consumer electronics and communication devices.
Testar is capable to handle 5, 6, 8 and 12" wafers with inkless or off-line ink process inside our class-1K environment. Our Final Testing Service performs electrical testing as well as customized test items, program and parameters. The pick-and-place handler could cover diversified package type of devices.
Testar Semiconductor Tesing also provides below Engineering services to make your device fast "Time to Market".
- Test program development
- Test program conversion
- Test Time reduction
- DFT consultant
- Multi-Site Testing development
Chroma 3680
Advanced SoC Test System
- 24 interchangeable slots for digital, analog and mixed-signal applications
- 150 Mbps up to 1Gbps data rate (muxed)
- Up to 512 sites parallel test
- Up to 2048 digital I/O pins
- 256 MW vector memory (512 MW option) (X2 mode)
- Up to 64 CH PMU for high precision measurement
- Per-pin timing measurement unit/PPMU/ frequency measurement
- Scan features to 8G depth/scan chain (16G option)
- Edge placement accuracy (EPA) : ±150ps
- Up to 128 CH High density DPS32
- High density HDADDA2 mixed-signal option
- Efficient high power HCDPS analog option
- High performance HDAVO option
- High density HDVI analog option
- High parallel HDRF option
- Direct probing system
- Multi-time domain function
- Microsoft Windows® 10 OS
- C#.NET and GUI programming interface
- CRISPro, full suite of intuitive software tools
- Test program and pattern converters for other platforms
- Accept DIB and probe card of other testers directly
- Support STDF data output and customized data format
- Air-cooled, small footprint tester-in-a-test-head design
Chroma 3650
SoC Test System
- 50 / 100 MHz clock rate;
- 100 / 200 Mbps (MUX) data rate
- Up to 640 digital I/O pins (testhead 2)
- 32 MW vector memory
- 32 MW pattern instruction memory
- Per-pin timing / PPMU / frequency measurement
- Scan features to 2G depth per scan chain
- ALPG option for memory test
- Up to 40 high-voltage pins
- Up to 8-32 16-bit ADDA channels option
- 32 high-performance DPS channels
- Edge placement accuracy ±300ps
- 32-CH HDADDA mixed-signal option
- 8-CH AWG and digitizer ASO mixed-signal audio band test option
- 40A pulse at 60V for MPVI analog option
- 32-CH / board for VI45 analog option
- 8-CH / board for PVI100 analog option
- MRX option for 3rd party PXI instruments
- Microsoft Windows® 7 / Windows® 10
- C++ and GUI programming interface
- CRISP, full suite of intuitive software tools
- Test program and pattern converters for other platforms
- Accept DIB and probe card of other testers directly
- Support STDF data output
- Air-cooled, small footprint tester-in-a-test-head design
Chroma 3380
VLSI Test System
- 50/100 MHz clock rate
- 50/100 Mbps data rate
- 1024 I/O pins (max. 1280 I/O pins)
- Up to 1024 sites parallel testing
- 32/64/128 pattern memory
- 16M capture memory per pin
- Various VI source
- Flexible hardware architecture (interchangeable I/O, VI, ADDA,)
- Real parallel trim/match function
- Time and frequency measurement unit (TFMU)
- STDF tools support
- Test program/pattern converter (J750, D10, S50/100, E320, SC312, V7, TRI-6036, etc.)
- AD/DA test (option)
- SCAN test option (max. 2G M/chain)
- ALPG test option for embedded memory
- CRAFT C/C++ programming language
- Software interface same as 3380P/3360P
- User-friendly Windows 7 environment