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Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
Semiconductor Testing
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IC Functional Testing
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Die sorting, Wafer Reconstruction (RECON)
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Test Services
Die sorting, Wafer Reconstruction (RECON)
Key Feature
Auto alignment
Up to 12” wafer
Chip size: Up to 7000um x 7000um
Fully Automation
Real-time data management
Flexibility of output form (Metal frame, Grip ring, GEL PAK, WAFFLE PAK, etc…)
Request For Quote
+886-3-327-9600
testarservice@testar.com.tw
68,Hwa-Ya 1st Road, Hwa-Ya Technology Park, Taoyuan Hsien 333, Taiwan
333桃園市龜山區華亞科學園區華亞一路68號
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About
Test Services
Optoelectronic Testing (LED, VCSEL/Photodiode)
Chip Probing
Die sorting, Wafer Reconstruction (RECON)
Automatic Visual Inspection (AVI)
Burn-in
Semiconductor Testing
Chip Probing
IC Functional Testing
Advantage
News
Contact